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Beilstein J. Nanotechnol. 2014, 5, 1491–1500, doi:10.3762/bjnano.5.162
Figure 1: Concentration profiles of Au(25nm)/Cu(50nm) system a) as deposited sample and annealed b) at 160 °C...
Figure 2: XRD θ–2θ patterns of Au(25nm)/Cu(50nm) samples a) as deposited, b) annealed at 180 °C for 5 h, c) f...
Figure 3: Concentration profiles of Au(10nm)/Cu(25nm) system a) as deposited and b) annealed at 180 °C for 5 ...
Figure 4: XRD θ–2θ patterns of Au(10nm)/Cu(25nm) annealed samples.
Figure 5: Concentration profiles of Au(25nm)/Cu(25nm) system a) as deposited sample and b) annealed samples.
Figure 6: XRD θ–2θ patterns of Au(25nm)/Cu(25nm) annealed samples.
Figure 7: Concentration profiles of Au(25nm)/Cu(12nm) system a) as deposited sample and b) annealed samples.
Figure 8: XRD θ–2θ patterns of Au(25nm)/Cu(12nm) annealed samples.
Figure 9: Bright field (top view) TEM images of Au(10nm)/Cu(15nm) bilayer a) as deposited and c) after 1 h of...
Figure 10: Dependence of the average concentration of elements on the annealing time at 150 °C in a) Au(25nm)/...